EngineeringScanning Microscopy for Nanotechnology : Techniques and Applications
Item 1 of 1
Item 1 of 1
SKU 9781441922090Publishing Ref 9781441922090
Springer
Scanning Microscopy for Nanotechnology : Techniques and Applications
Printed Book
SR 777
Inclusive of VAT
Sold as: EACH
SR47Per Month/24 months
SKU 9781441922090Publishing Ref 9781441922090
Author:Zhou, Weilie
Date of Publication: 2010
Book classification:Engineering,English Books
No. of pages:538 Pages
Format:Paperback
This book is printed on demand and is non-refundable after purchase
Available Formats :
Printed Book
It will be sent to your address
SR777
Incl. VAT
Choose your delivery preference
Secure Shopping
Convenient Returns
Genuine & Warranted
Fast Delivery
Or
About this Product
Fundamentals of Scanning Electron Microscopy (SEM).- Backscattering Detector and EBSD in Nanomaterials Characterization.- X-ray Microanalysis in Nanomaterials.- Low kV Scanning Electron Microscopy.- E-beam Nanolithography Integrated with Scanning Electron Microscope.- Scanning Transmission Electron Microscopy for Nanostructure Characterization.- to In-Situ Nanomanipulation for Nanomaterials Engineering.- Applications of FIB and DualBeam for Nanofabrication.- Nanowires and Carbon Nanotubes.- Photonic Crystals and Devices.- Nanoparticles and Colloidal Self-assembly.- Nano-building Blocks Fabricated through Templates.- One-dimensional Wurtzite Semiconducting Nanostructures.- Bio-inspired Nanomaterials.- Cryo-Temperature Stages in Nanostructural Research.