Scanning Microscopy for Nanotechnology : Techniques and Applications

Printed Book
SR 777
Inclusive of VAT
Sold as: EACH
SR47Per Month/24 months
Author:Zhou, Weilie
Date of Publication: 2010
Book classification:Engineering,English Books
No. of pages:538 Pages
Format:Paperback

This book is printed on demand and is non-refundable after purchase

Available Formats :

Printed Book

It will be sent to your address

SR777
Incl. VAT

Choose your delivery preference

Or

About this Product

Fundamentals of Scanning Electron Microscopy (SEM).- Backscattering Detector and EBSD in Nanomaterials Characterization.- X-ray Microanalysis in Nanomaterials.- Low kV Scanning Electron Microscopy.- E-beam Nanolithography Integrated with Scanning Electron Microscope.- Scanning Transmission Electron Microscopy for Nanostructure Characterization.- to In-Situ Nanomanipulation for Nanomaterials Engineering.- Applications of FIB and DualBeam for Nanofabrication.- Nanowires and Carbon Nanotubes.- Photonic Crystals and Devices.- Nanoparticles and Colloidal Self-assembly.- Nano-building Blocks Fabricated through Templates.- One-dimensional Wurtzite Semiconducting Nanostructures.- Bio-inspired Nanomaterials.- Cryo-Temperature Stages in Nanostructural Research.
Show more

Specifications

SKU9781441922090
Manufacturer Number9781441922090
year published2010
Show more

Report an issue with this product.

Customer Reviews