Software Defect and Operational Profile Modeling

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Author:Kai-Yuan Cai
Date of Publication: 2012
Book classification:Computer & Technology,English Books
No. of pages:292 Pages
Format:Paperback

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About this Product

also in: <em>THE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER</em> <em>AND INFORMATION SCIENCE</em>, Volume 1
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SKU9781461375593
Manufacturer Number9781461375593
year published2012
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