Design for Manufacturability and Statistical Design : A Constructive Approach

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Author:Orshansky, Michael
Date of Publication: 2010
Book classification:Engineering,English Books
No. of pages:332 Pages
Format:Paperback

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About this Product

Sources of Variability.- Front End Variability.- Back End Variability.- Environmental Variability.- Variability Characterization and Analysis.- Test Structures For Variability.- Statistical Foundations Of Data Analysis And Modeling.- Design Techniques for Systematic Manufacturability Problems.- Lithography Enhancement Techniques.- Ensuring Interconnect Planarity.- Statistical Circuit Design.- Statistical Circuit Analysis.- Statistical Static Timing Analysis.- Leakage Variability And Joint Parametric Yield.- Parametric Yield Optimization.- Conclusions.
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Specifications

SKU9781441940445
Manufacturer Number9781441940445
year published2010
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