Beam Effects

Surface Topographyand Depth Profiling in Surface Analysis

Printed Book
SR 1,079
Inclusive of VAT
Sold as: EACH
SR65Per Month/24 months
Author:Czanderna, Alvin W.
Date of Publication: 2010
Book classification:Saudi Arabia & The Arab World,English Books,
No. of pages:452 Pages
Format:Paperback

This book is printed on demand and is non-refundable after purchase

Available Formats :

Printed Book

It will be sent to your address

SR1,079
Incl. VAT

Choose your delivery preference

Or

About this Product

Many books are available that detail the basic principles of the different methods of surface characterization. On the other hand, the scientific literature provides a resource of how individual pieces of research are conducted by particular labo- tories. Between these two extremes the literature is thin but it is here that the present volume comfortably sits. Both the newcomer and the more mature scientist will find in these chapters a wealth of detail as well as advice and general guidance of the principal phenomena relevant to the study of real samples. In the analysis of samples, practical analysts have fairly simple models of how everything works. Superimposed on this ideal world is an understanding of how the parameters of the measurement method, the instrumentation, and the char- teristics of the sample distort this ideal world into something less precise, less controlled, and less understood. The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior.
Show more

Specifications

SKU9781441932990
Manufacturer Number9781441932990
year published2010
Show more

Report an issue with this product.

Customer Reviews