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  1. Anomalous X-Ray Scattering for Materials Characterization : Atomic-Scale Structure Determination
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Anomalous X-Ray Scattering for Materials Characterization : Atomic-Scale Structure Determination

Printed Book
SR 1,208
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SR73Per Month/24 months
Author:Waseda, Yoshio
Date of Publication: 2013
Book classification:Education,English Books
No. of pages:232 Pages
Format:Paperback

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About this Product

A new materials characterization methods, anomalous X-ray scattering, is presented in this book.
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Specifications

SKU9783662146378
Manufacturer Number9783662146378
year published2013
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