GISAXS and Complementary Microscopy Studies of Nanomaterials

The GISAXS technique is a technique of Surface Science monitoring and characterizing in situ and in real time, the evolution of nanostructures in the course of their growth process; starting from the early stages to the completeness. Some other techniques are already widely spread and common such as: spectroscopies, near field microscopies and structural characterization tools in the real space or observation in reciprocal space. Others are highly specialized laboratory tools available only around synchrotron radiation facilities in a very limited number of locations worldwide. The progress on the properties of devices, their profitable elaboration and their reliability are in adequacy with the corresponding improvement of the tools of Surface Science. Thus, there is more and more increasing needs in Nanoscience specially in characterization of nanomaterials for applications in industry. GISAXS is among these appropriate techniques need in the determination and characterization of the morphology of islands during their growth. Its use is often completed by other techniques such as Electron Microscopy.