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Springer
Disorder and Critical Phenomena Through Basic Probability Models : École dÉté de Probabilités de Saint-Flour XL - 2010
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About this Product
1 Introduction.- 2 Homogeneous pinning systems: a class of exactly solved models.- 3 Introduction to disordered pinning models.- 4 Irrelevant disorder estimates.- 5 Relevant disorder estimates: the smoothing phenomenon.- 6 Critical point shift: the fractional moment method.- 7 The coarse graining procedure.- 8 Path properties.
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