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Digital Noise Monitoring of Defect Origin

Printed Book
SR 777
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SR47Per Month/24 months
Author:Aliev, Telman
Date of Publication: 2010
Book classification:Engineering,English Books
No. of pages:236 Pages
Format:Paperback

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About this Product

Difficulties of Monitoring a Defect at Its Origin and Its Dataware Features.- Position-Binary Technology of Monitoring Defect at its Origin.- Technology of Digital Analysis of Noise as a Carrier of Information about the Beginning of a Defects Origin.- Robust Correlation Monitoring of a Defect at its Origin.- Spectral Monitoring of a Defects Origin.- The Digital Technology of Forecasting Failures by Considering Noise as a Data Carrier.- The Technology of Monitoring a Defects Origin by Considering Noise as a Data Carrier.
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Specifications

SKU9781441944108
Manufacturer Number9781441944108
year published2010
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