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  1. CCD Image Sensors in Deep-Ultraviolet : Degradation Behavior and Damage Mechanisms
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CCD Image Sensors in Deep-Ultraviolet : Degradation Behavior and Damage Mechanisms

Printed Book
SR 691
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Sold as: EACH
SR41Per Month/24 months
Author:Li, Flora
Date of Publication: 2010
Book classification:Engineering,English Books
No. of pages:244 Pages
Format:Paperback

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About this Product

Overview of CCD.- CCD Imaging in the Ultraviolet (UV) Regime.- Silicon.- Silicon Dioxide.- Si-SiO2 Interface.- General Effects of Radiation.- Effects of Radiation on CCDs.- UV-Induced Effects in Si.- UV Laser Induced Effects in SiO2.- UV Laser Induced Effects at the Si-SiO2 Interface.- CCD Measurements at 157nm.- Design Optimizations for Future Research.- Concluding Remarks.
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Specifications

SKU9783642061523
Manufacturer Number9783642061523
year published2010
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