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  1. Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching : Application to Rough and Natural Surfaces
Item 1 of 1
Item 1 of 1

Atomic Force Microscopy

Scanning Nearfield Optical Microscopy and Nanoscratching : Application to Rough and Natural Surfaces

Printed Book
SR 863
Inclusive of VAT
Sold as: EACH
SR52Per Month/24 months
Author:Kaupp, Gerd
Date of Publication: 2010
Book classification:Engineering,English Books,
No. of pages:308 Pages
Format:Paperback

This book is printed on demand and is non-refundable after purchase

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Printed Book

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Specifications

SKU9783642066634
Manufacturer Number9783642066634
year published2010
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